• DocumentCode
    1428760
  • Title

    A hidden Markov model-based algorithm for fault diagnosis with partial and imperfect tests

  • Author

    Ying, Jie ; Kirubarajan, T. ; Pattipati, Krishna R. ; Patterson-Hine, Ann

  • Author_Institution
    Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
  • Volume
    30
  • Issue
    4
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    463
  • Lastpage
    473
  • Abstract
    We present a hidden Markov model (HMM) based algorithm for fault diagnosis in systems with partial and imperfect tests. The HMM-based algorithm finds the most likely state evolution, given a sequence of uncertain test outcomes over time. We also present a method to estimate online the HMM parameters, namely, the state transition probabilities, the instantaneous probabilities of test outcomes given the system state and the initial state distribution, that are fundamental to HMM-based adaptive fault diagnosis. The efficacy of the parameter estimation method is demonstrated by comparing the diagnostic accuracies of an algorithm with complete knowledge of HMM parameters with those of an adaptive one. In addition, the advantages of using the HMM approach over a Hamming-distance based fault diagnosis technique are quantified. Tradeoffs in computational complexity versus performance of the diagnostic algorithm are also discussed
  • Keywords
    computational complexity; fault diagnosis; hidden Markov models; parameter estimation; probability; system monitoring; uncertain systems; uncertainty handling; Hamming-distance based fault diagnosis technique; computational complexity; diagnostic accuracy; fault diagnosis; hidden Markov model based algorithm; imperfect tests; initial state distribution; instantaneous probabilities; parameter estimation method; partial tests; state evolution; state transition probabilities; uncertain test outcome sequence; Fault diagnosis; Hidden Markov models; Intelligent sensors; Parameter estimation; Sampling methods; Signal processing algorithms; State estimation; Stochastic processes; System testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1094-6977
  • Type

    jour

  • DOI
    10.1109/5326.897073
  • Filename
    897073