• DocumentCode
    1429196
  • Title

    Microwave Multiport Measurements for the Digital World

  • Author

    Ferrero, Andrea ; Teppati, Valeria ; Fledell, Evan ; Grossman, Brett ; Ruttan, Tom

  • Author_Institution
    Electron. Dept., Politec. di Torino, Torino, Italy
  • Volume
    12
  • Issue
    1
  • fYear
    2011
  • Firstpage
    61
  • Lastpage
    73
  • Abstract
    We have seen that the challenges with multiport measurements for new digital applications are far from being solved. The evolution of multiport VNA architecture to partial reflectometers means that measurement of coupling between interconnects is cheaper and faster than with full reflectometer systems. However, given the very high connection density in these applications, the error model must still be extended to evaluate leakage between ports.
  • Keywords
    microwave reflectometry; network analysers; reflectometers; VNA; digital applications; error model; microwave multiport measurements; partial reflectometers; Calibration; Couplings; Digital communication; Frequency measurement; Microwave measurements; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2010.939305
  • Filename
    5691055
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1429196