Resonance transmission technique for the measurement of high dielectric permittivities

The difficulties of measurement at microwave frequencies of high dielectric permittivities, such as occur in ferroelectric materials, are discussed, as also are the difficulties of measurement of the dielectric loss tangents which are generally associated with these materials. A method is described which, based on the resonance transmission of a dielectric specimen in a tranmission line, has enabled permittivities of 10 000 ¿0 and values of tan ¿ of 0.25 to be measured over the microwave frequency ranges from u.h.f. to X band.