Measurement of Source Resistance in Top-Contact Organic Thin-Film Transistors

Author

Singh, Vinay K. ; Agrawal, Ashish K. ; Mazhari, Baquer

Author_Institution

Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India

Volume

33

Issue

3

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

441

Lastpage

443

Abstract

A method for measurement of source resistance in top-contact organic thin-film transistors is proposed, which uses an additional floating contact adjacent to the source to sense the channel voltage under the contact. This allows the source resistance to be directly estimated from a single device structure. Two-dimensional numerical simulation results are used to validate the proposed method. Experimental results obtained with pentacene thin-film transistors are presented to illustrate the proposed measurement technique.

Keywords

contact resistance; electric resistance measurement; numerical analysis; organic field effect transistors; organic semiconductors; thin film transistors; channel voltage sensing; floating contact; pentacene thin fllm transistors; source resistance measurement; top-contact organic thin film transistors; two-dimensional numerical simulation; Electrical resistance measurement; Logic gates; Organic thin film transistors; Resistance; Voltage measurement; Contact resistance; organic thin-film transistor (OTFT); pentacene;

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.2011.2179633

Filename

6138281