• DocumentCode
    1430093
  • Title

    A transfer function method for eddy current nondestructive testing

  • Author

    Tan, Mingjuan ; Yuan, Jiansheng ; Ma, Xinshan

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • Volume
    34
  • Issue
    5
  • fYear
    1998
  • fDate
    9/1/1998 12:00:00 AM
  • Firstpage
    3459
  • Lastpage
    3462
  • Abstract
    A transfer function method is introduced to eddy current nondestructive testing (ECT) in this paper. Actually ECT is used to investigate the differences of the materials with and without flaws. The transfer function of the tested materials for ECT is defined as the frequency property of the materials. With the transfer function method, the difference is an area bounded by the two transfer functions of the materials with and without flaws, while the impedance method can only provide a few discrete impedance values. Obviously, the area can provide more information of the materials than a few discrete values. The numerical and the experimental studies have proved that the transfer function method is an efficient approach for ECT
  • Keywords
    eddy current testing; eddy currents; nondestructive testing; transfer functions; eddy current nondestructive testing; electromagnetic analysis; frequency property; material flaws; transfer function method; Conducting materials; Eddy currents; Electrical capacitance tomography; Electromagnetic fields; Equations; Frequency; Impedance; Materials testing; Nondestructive testing; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.717815
  • Filename
    717815