DocumentCode :
1430502
Title :
A 60-ns 1-Mb nonvolatile ferroelectric memory with a nondriven cell plate line write/read scheme
Author :
Koike, Hiroki ; Otsuki, Tetsuya ; Kimura, Tohru ; Fukuma, Masao ; Hayashi, Yoshihiro ; Maejima, Yukihiko ; Amantuma, K. ; Tanabe, Nobuhiro ; Masuki, T. ; Saito, Shinobu ; Takeuchi, Tsuneo ; Kobayashi, Souta ; Kunio, Takemitsu ; Hase, Takashi ; Miyasaka, Y
Author_Institution :
NEC Corp., Kanagawa, Japan
Volume :
31
Issue :
11
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
1625
Lastpage :
1634
Abstract :
This paper proposes three circuit technologies for achieving mega-bit-class nonvolatile ferroelectric RAMs (NVFRAMs). The proposed nondriven cell plate line write/read scheme (NDP scheme) accomplishes fast write/read operation equivalent to that of DRAMs. Problems and countermeasures in introducing this scheme into NVFRAMs are also discussed. A proposed optimized CB/CS cell array design method provides a relationship between bit line capacitance CB and memory cell capacitance CS, which must be satisfied for read operations. Also reported is a reference voltage generator circuit that uses a dummy memory cell. This circuit can generate an accurate reference voltage despite the variety of capacitors with differing characteristics that are contained in the NVFRAM. A 1-Mb NVFRAM prototype featuring the above technologies has been fabricated, using a 1.0-μm CMOS process. This chip has an access time of 60 ns and a die size of 15.7×5.79 mm2
Keywords :
CMOS memory circuits; ferroelectric storage; random-access storage; 1 Mbit; 60 ns; CMOS process; NVFRAM; bit line capacitance; cell array design; circuit technology; dummy memory cell; memory cell capacitance; nondriven cell plate line write/read scheme; nonvolatile ferroelectric memory; reference voltage generator circuit; Capacitance; Character generation; Circuits; Design methodology; Design optimization; Ferroelectric films; Ferroelectric materials; Nonvolatile memory; Random access memory; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1996.542307
Filename :
542307
Link To Document :
بازگشت