Title :
X-ray diffraction — New eyes on the process
Author :
Anderson, Jon ; Gobbo, Luciano ; van Weeren, Harald
Author_Institution :
PANalytical, St. Laurent, QC, Canada
Abstract :
X-ray Diffraction (XRD) analysis of cement process materials has grown beyond its roots in the laboratory to become an important tool for process control. Combined with its partners, XRF and CNA, these techniques can provide valuable process control information - essentially “new eyes” - to guide process control decisions. Important developments in the XRD analyzers have decreased analysis time from hours to minutes to provide quick results that enable timely process control decisions. XRD phase analysis can provide information to optimize combustion control, mix chemistry, cooler operation as well as additive mixtures in finish cement. The paper will provide an overview of all the XRF/XRD applications and then focus on the XRD process control opportunities.
Keywords :
X-ray diffraction; additives; cements (building materials); combustion; quality control; CNA; X-ray diffraction; XRD phase analysis; XRF; additive mixture; cement process material; combustion control; Correlation; Fly ash; Process control; Slag; X-ray diffraction; X-ray scattering; Amorphous; Cement Process Control; Clinker; Neutron Analysis; Quality Assurance; Quality Control; Rietveld Refinement; X-Ray Diffraction; X-ray Fluorescence;
Conference_Titel :
Cement Industry Technical Conference (CIC), 2014 IEEE-IAS/PCA
Conference_Location :
National Harbor, MD
Print_ISBN :
978-1-4799-3293-1
DOI :
10.1109/CITCon.2014.6820126
