DocumentCode :
1431168
Title :
Multiferroic and fatigue behavior of BiFe0.95Mn0.05O3/Bi0.90La0.10Fe0.85Zn0.15O3 bilayered thin films
Author :
Wu, Jiagang ; Wang, John ; Xiao, Dingquan ; Zhu, Jianguo
Author_Institution :
Dept. of Mater. Sci., Sichuan Univ., Chengdu, China
Volume :
59
Issue :
1
fYear :
2012
fDate :
1/1/2012 12:00:00 AM
Firstpage :
14
Lastpage :
20
Abstract :
Bilayered thin films consisting of BiFe0.95Mn0.05O3 (BFMO) and Bi0.90La0.10Fe0.85Zn0.15O3 (BLFZO) layers were prepared on Pt-coated silicon substrates without any buffer layers by RF sputtering. The (110) orientation was induced with a high phase purity for all bilayers as a result of the introduction of the bottom (110)-oriented BLFZO layer. The low leakage current density of BFMO/BLFZO bilayers could be attributed to a combined effect of the BFMO and BLFZO layers. The dielectric constant increases, the remanent polarization decreases, and the coercive field slightly increases with increasing thickness of the BLFZO layer in BFMO/BLFZO bilayers. Magnetic properties in BFMO/BLFZO bilayers are improved by increasing the BFMO layer thicknesses. A large polarization value of 2Pr ~ 189.5 μC/cm2 is obtained for the BFMO/BLFZO bilayer with a thickness ratio of 3:1, which is much larger than those reported for BFO-based single layers or multilayers, and a good fatigue behavior is demonstrated with an increase in measurement frequencies and driving electric fields.
Keywords :
bismuth compounds; buffer layers; coercive force; current density; dielectric polarisation; fatigue; ferroelectric coercive field; ferroelectric thin films; lanthanum compounds; leakage currents; magnetic multilayers; magnetic thin films; multiferroics; permittivity; remanence; sputter deposition; BiFe0.95Mn0.05O3-Bi0.90La0.10Fe0.85Zn0.15O3; Pt-Si; Pt-coated silicon substrate; RF sputtering; bilayered thin films; buffer layers; coercive field; dielectric constant; fatigue behavior; leakage current density; magnetic properties; multiferroics; multilayers; phase purity; remanent polarization; Electric fields; Electric variables measurement; Fatigue; Frequency measurement; Leakage current; Magnetic properties; Substrates;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2012.2151
Filename :
6138722
Link To Document :
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