• DocumentCode
    1431242
  • Title

    Rigorous modeling of packaged Schottky diodes by the nonlinear lumped network (NL2N)-FDTD approach

  • Author

    Emili, Gianluca ; Alimenti, Federico ; Mezranotte, P. ; Roselli, Luca ; Sorrentino, Roberto

  • Author_Institution
    Dipt. di Ingenia Electron. e dell´´Inf., Perugia Univ., Italy
  • Volume
    48
  • Issue
    12
  • fYear
    2000
  • fDate
    12/1/2000 12:00:00 AM
  • Firstpage
    2277
  • Lastpage
    2282
  • Abstract
    Recently, a novel method has been proposed that allows general linear lumped networks to be incorporated within finite-difference time-domain (FDTD) simulators. In this paper, this method is extended in such a way as to represent two-terminal nonlinear lumped networks in a single FDTD grid cell. In particular, the extended method is applied to the rigorous modeling of packaged Schottky diodes. The implementation is first validated in the case of a diode connected to a voltage source. The SPICE simulator has been used to provide reference results. The same structure has also been used to establish the accuracy of the method, It has been demonstrated that such accuracy is significantly increased with respect to that of the conventional lumped-element-FDTD approach, Finally, the technique has been validated against measured results, showing a good agreement
  • Keywords
    Schottky diodes; equivalent circuits; finite difference time-domain analysis; lumped parameter networks; semiconductor device models; semiconductor device packaging; FDTD simulators; finite-difference time-domain simulators; modeling; nonlinear lumped network-FDTD approach; packaged Schottky diodes; single FDTD grid cell; two-terminal nonlinear lumped networks; Circuit simulation; Circuit topology; Finite difference methods; Millimeter wave circuits; Network topology; Packaging; Resistors; Schottky diodes; Time domain analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.898975
  • Filename
    898975