DocumentCode :
1431248
Title :
Influence of crystal quality on the excitation and propagation of surface and bulk acoustic waves in polycrystalline AlN films
Author :
Clement, Marta ; Olivares, Jimena ; Capilla, Jose ; Sangrador, Jesús ; Iborra, Enrique
Author_Institution :
Grupo de Microsistemas y Mater. Elec tronicos del Centro de Mater. y Dispositivos Av. para las TIC (GMME-CEMDATIC), Univ. Politec. de Madrid, Madrid, Spain
Volume :
59
Issue :
1
fYear :
2012
fDate :
1/1/2012 12:00:00 AM
Firstpage :
128
Lastpage :
134
Abstract :
We investigate the excitation and propagation of acoustic waves in polycrystalline aluminum nitride films along the directions parallel and normal to the c-axis. Longitudinal and transverse propagations are assessed through the frequency response of surface acoustic wave and bulk acoustic wave devices fabricated on films of different crystal qualities. The crystalline properties significantly affect the electromechanical coupling factors and acoustic properties of the piezoelectric layers. The presence of misoriented grains produces an overall decrease of the piezoelectric activity, degrading more severely the excitation and propagation of waves traveling transversally to the c-axis. It is suggested that the presence of such crystalline defects in c-axis-oriented films reduces the mechanical coherence between grains and hinders the transverse deformation of the film when the electric field is applied parallel to the surface.
Keywords :
III-V semiconductors; acoustic wave propagation; aluminium compounds; bulk acoustic wave devices; crystal defects; deformation; electric fields; excited states; grain size; piezoelectric semiconductors; piezoelectric thin films; piezoelectricity; semiconductor thin films; surface acoustic waves; wide band gap semiconductors; AlN; acoustic properties; bulk acoustic wave devices; crystal defects; crystalline properties; deformation; electric field; electromechanical coupling factors; excitation; grain size; mechanical coherence; piezoelectric layers; polycrystalline aluminum nitride films; surface acoustic wave propagation; transverse propagations; Acoustic waves; Couplings; Crystals; Films; Reflection; Substrates; Surface acoustic wave devices;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2012.2163
Filename :
6138734
Link To Document :
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