Title :
An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling
Author :
Heo, Deukhyoun ; Gebara, Edward ; Chen, Yi-Jan Emery ; Yoo, Seung-Yup ; Hamai, Michael ; Suh, Youngsuk ; Laskar, Joy
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
12/1/2000 12:00:00 AM
Abstract :
An improved deep submicrometer (0.25 μm) MOSFET radio-frequency (RF) large signal model that incorporates a new breakdown current model and drain-to-substrate nonlinear coupling was developed and investigated using various experiments. An accurate breakdown model is required for deep submicrometer MOSFETs due to their relatively low breakdown voltage. For the first time, this RF nonlinear model incorporates the breakdown voltage turnover trend into a continuously differentiable channel current model and a new nonlinear coupling circuit between the drain and the lossy substrate. The robustness of the model is verified with measured pulsed I-V, S-parameters, power characteristics, harmonic distortion, and intermodulation distortion levels at different input and output termination conditions, operating biases, and frequencies
Keywords :
MOSFET; S-parameters; UHF field effect transistors; avalanche breakdown; capacitance; electric admittance; equivalent circuits; harmonic distortion; intermodulation distortion; microwave field effect transistors; semiconductor device breakdown; semiconductor device models; silicon; 0.1 to 10 GHz; IMD levels; MOSFET RF nonlinear model; RF large signal model; S-parameters; Si; breakdown current model; breakdown voltage turnover trend; continuously differentiable channel current model; deep submicron MOSFET model; drain-to-substrate nonlinear coupling; harmonic distortion; intermodulation distortion; lossy substrate; power characteristics; pulsed I-V characteristics; radiofrequency large signal model; termination conditions; Breakdown voltage; Coupling circuits; Distortion measurement; Electric breakdown; MOSFET circuits; Power measurement; Pulse measurements; RF signals; Radio frequency; Robustness;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on