DocumentCode :
1431424
Title :
Characterizing transient measurements by use of the step response and the convolution integral
Author :
McKnight, Ronald H. ; Lagnese, John E. ; Zhang, Yi Xin
Author_Institution :
US DOE, Washington, DC, USA
Volume :
39
Issue :
2
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
346
Lastpage :
352
Abstract :
A method of determining the suitability of a divider system for making measurements of high-voltage transients is described. This method involves the convolution of the experimentally determined step response of the divider with various analytic waveforms which represent ideal waveforms expected in the experimental arrangement. The result of the convolution is compared, both graphically and in terms of relevant parameters such as peak amplitude and front time, with the original waveform. This procedure allows the distortion introduced by the convolution calculation to be seen clearly. The numerical implementation of the method is easily run on a personal computer
Keywords :
high-voltage techniques; step response; transients; voltage dividers; voltage measurement; waveform analysis; analytic waveforms; convolution integral; distortion; divider system; front time; high-voltage transients; ideal waveforms; peak amplitude; personal computer; step response; transient measurements; Bandwidth; Convolution; Distortion measurement; Frequency domain analysis; Helium; Integral equations; Microcomputers; Particle measurements; Transfer functions; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.52513
Filename :
52513
Link To Document :
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