• DocumentCode
    1431668
  • Title

    Integrated Voltage Reference Generator for GaN Smart Power Chip Technology

  • Author

    Wong, King-Yuen ; Chen, Wanjun ; Chen, Kevin J.

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    952
  • Lastpage
    955
  • Abstract
    GaN smart power chip technology has been realized using a GaN-on-Si HEMT platform, featuring monolithically integrated high-voltage power devices and low-voltage peripheral devices for mixed-signal functional blocks. In particular, this brief presents the imperative analog functional block-voltage reference generator for smart power applications with wide-temperature-range stability. The circuit is capable of proper functions within a wide temperature range from room temperature up to 250°C , illustrating the unique advantage of the wide-bandgap GaN in high-temperature operation. The voltage reference generator was designed with an AlGaN/GaN HEMT and Schottky diodes, and the devices were operated in the subthreshold regime to obtain low power consumption. The voltage reference generator achieved an average drift of less than 0.5 mV/°C and can be used as a reference voltage in various biasing and sensing circuits.
  • Keywords
    III-V semiconductors; Schottky diodes; Zener diodes; aluminium compounds; avalanche diodes; high electron mobility transistors; monolithic integrated circuits; power integrated circuits; silicon; wide band gap semiconductors; AlGaN-GaN; HEMT platform; Schottky diodes; imperative analog functional block; integrated voltage reference generator; low-voltage peripheral devices; mixed-signal functional blocks; monolithically integrated high-voltage power devices; power consumption; sensing circuits; smart power chip technology; temperature 293 K to 298 K; wide-bandgap high-temperature operation; wide-temperature-range stability; Aluminum gallium nitride; Circuit stability; Energy consumption; Gallium nitride; HEMTs; Integrated circuit technology; Power generation; Schottky diodes; Temperature distribution; Voltage; AlGaN/GaN HEMT; GaN; planar integration; smart power; voltage reference; wide bandgap;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2041510
  • Filename
    5424059