Title :
Spatial Characterization of Resistive Transition in YBCO Thin Film
Author :
Mori, Masato ; Nishioka, Hideyoshi ; Baba, Jumpei ; NItta, Tanzo ; Kumagai, Toshiya ; Shibuya, Masatoyo
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
fDate :
6/1/2011 12:00:00 AM
Abstract :
The appearance of resistance in YBCO thin films used in resistive type superconducting fault current limiters has not been clarified completely. Understanding this process should help to prevent failures in superconducting films due to overheating. In this paper, the voltage distribution of a YBCO thin film is measured by probes arranged in a 2-dimensional pattern on the film surface in order to map how the normal state area expands under the influence of a sinusoidal current of several hundred amperes flowing into the film. This measurement was performed on several thin films.
Keywords :
superconducting fault current limiters; thin film resistors; YBCO thin film; failure prevention; resistive transition; resistive type superconducting fault current limiters; sinusoidal current; superconducting films; voltage distribution; Critical current density; Current measurement; Density measurement; Electrical resistance measurement; Resistance; Voltage measurement; Yttrium barium copper oxide; Resistive type SFCL; S/N transition; YBCO thin film; superconducting fault current limiter;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2100093
