Magnetic properties of grain-oriented silicon iron. Part 5: Stress sensitivity of the dynamic (50 Hz) magnetostriction

Author

Simmons, G.H. ; Thompson, J.E.

Author_Institution

University of Wales Institute of Science & Technology, Wolfson Centre for the Technology of Soft Magnetic Materials, Department of Electrical Engineering, Cardiff, UK

Volume

118

Issue

9

fYear

1971

fDate

9/1/1971 12:00:00 AM

Firstpage

1302

Lastpage

1306

Abstract

The stress sensitivity of a number of laminations has been measured for both compressive and tensile stresses (0 Â± 6 Ã— 106 N/m2) applied in two perpendicular directions in the plane of the sheet, and the results discussed in relation to previous work and theories. Using the device and technique described in Pt. 1, the dynamic magnetostriction has been measured for three individual large grains of different orientation in polycrystalline laminations. The experimental results are explained in terms of changes in the observed domain structure. A theoretical model was developed to explain the negative dynamic magnetostriction, and a verification of the proposed model has been attempted by making additional measurements on polycrystalline samples.

Keywords

magnetostriction; sensitivity; stress effects; compressive; domain structure; dynamic magnetostriction; grains; magnetic materials; magnetic properties; orientation; polycrystalline laminations; silicon iron; stress sensitivity; tensile stresses; theoretical model;

fLanguage

English

Journal_Title

Electrical Engineers, Proceedings of the Institution of

Publisher

iet

ISSN

0020-3270

Type

jour

DOI

10.1049/piee.1971.0237

Filename

5251423