Title :
Indium migration and controlled lateral bandgap variations in high-power strained layer InGaAs-AlGaAs lasers grown on nonplanar substrates
Author :
Brovelli, Luigi R. ; Arent, Douglas J. ; Jaeckel, Heinz ; Meier, Heinz P.
Author_Institution :
IBM Zurich Res. Lab., Ruschlikon, Switzerland
fDate :
6/1/1991 12:00:00 AM
Abstract :
Strained single quantum well (SQW) InGaAs-AlGaAs graded-index separate confinement heterostructure (GRINSCH) lasers were grown by molecular beam epitaxy over nonplanar (100) oriented substrates. Large variations were observed in the effective bandgap of the strained quantum well as a function of the width of the underlying substrate ridge or groove. These variations are associated with increased In composition in the strained quantum well which arises from incorporation of adatoms migrating from the low growth (311)A side facet to the preferential growth (100) active area facet. The properties of laser structures consisting of two separately contacted segments along the laser cavity with different bandgaps were investigated. Using the segment with the larger bandgap as passive waveguide cavity, its bandtail absorption and characteristic Urbach energy were measured by comparing the transmitted to the directly emitted spontaneous emission
Keywords :
III-V semiconductors; aluminium compounds; energy gap; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor growth; semiconductor junction lasers; III-V semiconductor; In migration; InGaAs-AlGaAs; SQW GRINSCH laser; Urbach energy; adatoms; bandtail absorption; controlled lateral bandgap variations; directly emitted spontaneous emission; groove; high-power strained layer InGaAs-AlGaAs lasers; laser cavity; molecular beam epitaxy; nonplanar substrates; passive waveguide cavity; substrate ridge; transmitted spontaneous emission; Etching; Gallium arsenide; Indium; Mirrors; Molecular beam epitaxial growth; Photonic band gap; Quantum well lasers; Strain control; Substrates; Waveguide lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of