DocumentCode
1432293
Title
International Semiconductor Conference (CAS)
Volume
10
Issue
1
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
172
Lastpage
172
Abstract
Provides notice of upcoming conference events of interest to practitioners and researchers.
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2010.2044614
Filename
5424180
Link To Document