DocumentCode :
1432321
Title :
Characterization of bolometers based on polycrystalline silicon germanium alloys
Author :
Sedky, S. ; Fiorini, P. ; Caymax, M. ; Baert, C. ; Hermans, L. ; Mertens, R.
Author_Institution :
IMEC, Leuven, Belgium
Volume :
19
Issue :
10
fYear :
1998
Firstpage :
376
Lastpage :
378
Abstract :
In this paper, we report on the first realization and characterization of uncooled Infra Red (IR) bolometers, based on polycrystalline alloys of silicon and germanium (poly SiGe). Responsivity, thermal conductance, thermal time constant and noise will be analyzed. It will be shown that poly SiGe provides high thermal insulation. An average detectivity of 10/sup 8/ cm/spl radic/(Hz)/W has been measured. We expect that modifications in the device structure could allow to achieve detectivities of 10/sup 9/ cm /spl radic/(Hz)/W.
Keywords :
Ge-Si alloys; bolometers; infrared detectors; semiconductor materials; Si-Ge; detectivity; infrared bolometer; noise; polycrystalline silicon germanium alloy; responsivity; thermal conductance; thermal insulation; thermal time constant; Amorphous semiconductors; Bolometers; Germanium alloys; Germanium silicon alloys; Immune system; Integrated circuit noise; Semiconductor device noise; Silicon alloys; Silicon germanium; Thermal conductivity;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.720191
Filename :
720191
Link To Document :
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