Title :
Fabrication of 2D silicon nano-mold based on sidewall transfer
Author :
Jie Rao ; Helin Zou ; Syms, Richard R. A. ; Cheng, Eddie ; Chong Liu
Author_Institution :
Res. Center for Micro Syst. Technol. (MST), Dalian Univ. of Technol., Dalian, China
fDate :
1/1/2011 12:00:00 AM
Abstract :
A method based on the sidewall transfer technique for fabricating two-dimensional (2D) nano-mold on a silicon substrate was developed. Instead of using expensive nanolithography, the authors fabricated 2D silicon nano-mold using standard ultraviolet lithography, conformal deposition of gold by radio frequency sputtering, argon sputter etching and deep reactive ion etching (DRIE). This technique enables the generation of very fine geometries with nanoscale dimensions without the electron-beam (e-beam) lithography equipment or other additional lithography techniques. Based on SF6, O2 and C4F8 plasmas, a vertical mold profile and a minimum scallop size of 30 nm were obtained by optimising DRIE parameters. For smooth mold surfaces, the authors report and demonstrate a new mechanism of removing grass obtained during inductively coupled plasma etching. With this technique, very uniform 2D silicon nano-molds consisting of 200 nm wide, 200 nm high and 4.3 mm long bar arrays have been successfully fabricated.
Keywords :
elemental semiconductors; gold; nanofabrication; nanostructured materials; photolithography; plasma deposition; semiconductor growth; silicon; sputter deposition; sputter etching; surface structure; ultraviolet lithography; 2D silicon nanomold; Au; C4F8 plasma deposition; O2 plasma deposition; SF6 plasma deposition; Si; argon sputter etching; conformal radio frequency sputtering deposition; deep reactive ion etching; electron-beam lithography; sidewall transfer technique; size 200 nm; size 4.3 mm; smooth mold surface; ultraviolet lithography;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2010.0155