DocumentCode
1432450
Title
Power-independent degradation of high-power GaAlAs lasers with nonabsorbing mirrors
Author
Naito, Hiroki ; Kume, Masahiro ; Hamada, Ken ; Shimizu, Hirokazu ; Kazumura, Masaru ; Kano, Gota ; Teramoto, Iwao
Author_Institution
Matsushita Electron. Corp., Osaka, Japan
Volume
27
Issue
6
fYear
1991
fDate
6/1/1991 12:00:00 AM
Firstpage
1550
Lastpage
1554
Abstract
The reliability of high-power single-mode GaAlAs lasers with nonabsorbing mirrors (NAMs) was investigated in detail. The lasers were tested at various output powers and temperatures. The aging test was performed under constant power in order to examine the output power dependence. In order to carry out the measurement with accuracy, the heat sink temperature was controlled with an error of ±0.1°C, and the operating current was measured every hour or every 10 h. As a result, very smooth aging test curves were obtained. Output powers of the coated lasers in the aging tests were 30, 50, and 100 mW, and the temperatures of the heat sink were 50, 70, and 90°C. conventional lasers without a NAM were tested for comparison. The results indicate that the degradation of the lasers is dependent not on the output power, but on the operating current and temperature. The thermal activation energy and the degradation rate is estimated to be 0.85 eV
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; life testing; mirrors; reliability; semiconductor junction lasers; 100 mW; 30 mW; 50 degC; 50 mW; 70 degC; 90 degC; GaAlAs; III-V semiconductor; accuracy; aging test; degradation rate; heat sink temperature; high-power single-mode GaAlAs lasers; nonabsorbing mirrors; operating current; output powers; power independent degradation; reliability; temperatures; thermal activation energy; Aging; Current measurement; Heat sinks; Mirrors; Performance evaluation; Power generation; Power lasers; Temperature; Testing; Thermal degradation;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.89976
Filename
89976
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