DocumentCode :
1432591
Title :
Improving SiC JFET Switching Behavior Under Influence of Circuit Parasitics
Author :
Josifovic, I. ; Popovic-Gerber, J. ; Ferreira, Jan Abraham
Author_Institution :
Electr. Power Process. Group, Delft Univ. of Technol., Delft, Netherlands
Volume :
27
Issue :
8
fYear :
2012
Firstpage :
3843
Lastpage :
3854
Abstract :
This paper investigates the switching behavior of normally OFF silicon carbide (SiC) JFETs in an inverter for a motor drive. The parasitic ringing caused by different parasitic effects is analyzed. Two different methods, the use of an RC snubber and the use of suppression ferrite component, are investigated for dampening the parasitic oscillations. It is found that applying a ferrite bead not only dampens the parasitic oscillations, but also results in significantly lower switching losses. Furthermore, it is shown that the capacitive coupling between SiC devices in the bridge leg and heat sinks significantly deteriorates the JFETs´ switching performance. The effect of two substrates, an insulated metal substrate and a printed circuit board, on the capacitive coupling is investigated. A method in which the use of two separate heat spreaders minimizes the capacitive coupling, thus, exploiting the full potential of fast SiC JFETs is proposed.
Keywords :
heat sinks; invertors; junction gate field effect transistors; motor drives; power field effect transistors; printed circuits; silicon compounds; snubbers; wide band gap semiconductors; RC snubber; SiC; SiC JFET switching behavior; bridge leg; capacitive coupling; circuit parasitics; heat sinks; heat spreaders; insulated metal substrate; inverter; motor drive; parasitic oscillations; printed circuit board; suppression ferrite component; switching losses; Couplings; Heat sinks; JFETs; Logic gates; Oscillators; Silicon carbide; Switches; Capacitive coupling; parasitic oscillations; ringing dampening; silicon carbide (SiC) JFET;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2012.2185951
Filename :
6140582
Link To Document :
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