Title :
Wavelet based texture modeling for the classification of very high resolution maritime pine forest images
Author :
Regniers, O. ; Bombrun, L. ; Guyon, D. ; Samalens, J.-C. ; Tinel, C. ; Grenier, G. ; Germain, C.
Author_Institution :
Lab. IMS, Univ. of Bordeaux, Talence, France
Abstract :
This study evaluates the potential of wavelet-based texture modeling for the classification of stand age in a managed maritime pine forest using very high resolution satellite data. A cross-validation approach based on stand age reference data shows that multivariate modeling of the spatial dependence of wavelet coefficients outperforms the use of features derived from co-occurrence matrices. Simultaneously adding features representing the color dependence and leveling the dominant orientation in anisotropic forest stands enhances the classification performances. These results obtained from panchromatic and multispectral PLEIADES data confirm the ability of such wavelet-based multivariate models to efficiently capture the textural properties of very high resolution forest data and opens up perspectives for their use in the mapping of mono-specific forest structure variables.
Keywords :
geophysical image processing; image classification; image resolution; image texture; matrix algebra; vegetation mapping; wavelet transforms; anisotropic forest stands; color dependence; cooccurrence matrices; cross-validation approach; managed maritime pine forest; monospecific forest structure variable mapping; multispectral PLEIADES data; multivariate modeling; panchromatic PLEIADES data; spatial dependence; stand age classification; stand age reference data; textural properties; very high resolution maritime pine forest images; very high resolution satellite data; wavelet based texture modeling; wavelet coefficient; wavelet-based multivariate model; wavelet-based texture modeling; Computational modeling; Data models; Feature extraction; Image color analysis; Image resolution; Vegetation; Wavelet coefficients; classification; forest structure; texture analysis; very high resolution; wavelet;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location :
Quebec City, QC
DOI :
10.1109/IGARSS.2014.6946861