Analysis of current crowding effects in multiturn spiral inductors

Author

Kuhn, William B. ; Ibrahim, Noureddin M.

Author_Institution

Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA

Volume

49

Issue

1

fYear

2001

fDate

1/1/2001 12:00:00 AM

Firstpage

31

Lastpage

38

Abstract

The effective trace resistance of a multiturn spiral inductor operating at high frequencies is known to increase dramatically above its dc value, due to proximity effect or current crowding. This phenomenon, which dominates resistance increases due to skin effect, is difficult to analyze precisely and has generally required electromagnetic simulation for quantitative assessment. Current crowding is studied in this paper through approximate analytical modeling, and first-order expressions are derived for predicting resistance as a function of frequency. The results are validated through comparisons with electromagnetic simulations and compared with measured data taken from a spiral inductor implemented in a silicon-on-sapphire process

Keywords

MMIC; current distribution; eddy current losses; inductors; integrated circuit modelling; lumped parameter networks; skin effect; approximate analytical modeling; current crowding effects; current distribution; eddy current losses; effective trace resistance; electromagnetic simulations; field redistribution; first-order expressions; frequency dependence; lumped element model; multiturn spiral inductors; proximity effect; silicon-on-sapphire process; skin effect; Analytical models; Electrical resistance measurement; Electromagnetic analysis; Electromagnetic induction; Frequency; Inductors; Predictive models; Proximity effect; Skin effect; Spirals;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.899959

Filename

899959