Accuracy evaluation of on-wafer load-pull measurements

Author

Ferrero, Andrea ; Teppati, Valeria ; Carullo, Alessio

Author_Institution

Dipt. di Elettronica, Politecnico di Torino, Italy

Volume

49

Issue

1

fYear

2001

fDate

1/1/2001 12:00:00 AM

Firstpage

39

Lastpage

43

Abstract

This paper investigates the residual calibration uncertainty effects in on-wafer load-pull measurements. After the systematic error correction (based on a traditional error-box model) has been applied, the residual uncertainty on absolute-power-level measurements can dramatically affect the accuracy of typical nonlinear parameters such as gain and power-added efficiency under different load conditions. The main residual uncertainty contributions are highlighted both by a theoretical analysis and experiments. Finally, one of the possible causes for intermodulation-distortion measurement errors is shown

Keywords

calibration; error correction; intermodulation distortion; measurement errors; measurement uncertainty; microwave measurement; network analysers; power measurement; NWA; TWTA noise effects; absolute-power-level measurements; accuracy evaluation; different load conditions; error-box model; gain parameters; input amplifier IMD; intermodulation-distortion measurement errors; microwave measurements; nonlinear parameters; on-wafer load-pull measurements; power-added efficiency; residual calibration uncertainty effects; systematic error correction; Calibration; Error correction; Gain measurement; Impedance; Measurement uncertainty; Power amplifiers; Power generation; Power measurement; Real time systems; Tuners;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.899960

Filename

899960