Title : 
Multifunctional Field-Effect Transistor for High-Density Integrated Circuits
         
        
            Author : 
Marino, Fabio Alessio ; Meneghesso, Gaudenzio
         
        
            Author_Institution : 
Dept. of Electr. Eng., Univ. of Padova, Padova, Italy
         
        
        
        
        
            fDate : 
3/1/2011 12:00:00 AM
         
        
        
        
            Abstract : 
A multifunctional field-effect transistor (FET) for the manufacturing of high-density integrated circuits (ICs) has been developed and fabricated. Furthermore, an extensive numerical device simulation campaign has been carried out in order to characterize the new structure. Such device is a metal-oxide-semiconductor (MOS) FET that simultaneously performs the functions of two traditional FETs (an n-channel MOS and a p-channel MOS), working as one or as the other according to the voltage applied to the gate´s terminal. Combinational and sequential circuits employing the new technology introduce, with respect to the standard complementary MOS (CMOS) ones, a drastic reduction of both the required device number and the parasitic capacitances. This leads to a significant increase in the circuit´s speed. Furthermore, the ICs obtained with these transistors are fully compatible with the standard CMOS technology and fabrication process.
         
        
            Keywords : 
CMOS logic circuits; MOSFET; combinational circuits; integrated circuit manufacture; numerical analysis; sequential circuits; CMOS technology; MOSFET; combinational circuits; fabrication process; gate terminal; high-density integrated circuits; metal-oxide-semiconductor field-effect transistor; multifunctional field-effect transistor; numerical device simulation; parasitic capacitances; sequential circuits; Alternative complementary metal–oxide–semiconductor (CMOS) technology; metal–oxide–semiconductor field-effect transistor (MOSFET) device; multifunctional metal–oxide–semiconductor (MOS); numerical simulation;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/LED.2010.2099097