• DocumentCode
    1433170
  • Title

    Novel Nanophase-Switching ESD Protection

  • Author

    Lin, Lin ; Zhang, Lijie ; Wang, Xin ; Liu, Jian ; Zhao, Hui ; Tang, He ; Fang, Qiang ; Shi, Zitao ; Wang, Albert ; Huang, Ru ; Cheng, Yuhua

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
  • Volume
    32
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    378
  • Lastpage
    380
  • Abstract
    This letter reports the proof-of-concept results for the new nontraditional nanophase-switching electrostatic-discharge (ESD) protection mechanism and nanocrossbar ESD structures. Experiment shows good ESD switching and protection, i.e., a fast response of 100 ps, a ultralow leakage of 0.26 pA, and an ESD protection of >; 267 V/μm2. A new dispersed local ESD tunneling model is proposed, and heterogeneous complementary metal-oxide-semiconductor integration is developed.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; nanoelectronics; switching; dispersed local ESD tunneling model; electrostatic-discharge protection; heterogeneous complementary MOS integration; nanocrossbar ESD structures; nanophase-switching ESD protection; ultralow leakage; Electrostatic discharge (ESD); nanocrossbar; nanophase switching (NPS);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2099100
  • Filename
    5699342
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1433170