Title :
Locating bridging faults using dynamically computed stuck-at fault dictionaries
Author :
Gong, Yiming ; Chakravarty, Sreejit
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
fDate :
9/1/1998 12:00:00 AM
Abstract :
Novel algorithms for locating bridging faults, based on the voting and wired models, in combinational circuits are presented. The algorithm uses small portions of the stuck-at fault dictionary, not the bridge fault dictionary, computed during fault location. This, along with an implicit representation of bridging faults, contributes significantly to the efficiency of the algorithm. Experimental evaluation of the algorithm on ISCAS circuits is presented
Keywords :
circuit analysis computing; combinational circuits; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; bridging faults location; combinational circuits; dynamically computed fault dictionaries; implicit fault representation; stuck-at fault dictionaries; voting model; wired models; Bridge circuits; Circuit faults; Circuit testing; Computer science; Dictionaries; Failure analysis; Fault diagnosis; Fault location; Semiconductor device modeling; Voting;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
