Title :
Millimeter-Wave Surface Impedance Characterization of HTS Films and Single Crystals Using Quasi-Optical Sapphire Resonators
Author :
Cherpak, Nickolay T. ; Barannik, Alexander A. ; Bunyaev, Sergiy A. ; Prokopenko, Yury V. ; Torokhtii, Kostyantyn I. ; Vitusevich, Svetlana A.
Author_Institution :
Usikov Inst. of Radiophys. & Elecronics, NAS of Ukraine, Kharkiv, Ukraine
fDate :
6/1/2011 12:00:00 AM
Abstract :
High-Q sapphire quasi-optical dielectric resonators (QDRs) excited on whispering-gallery modes are key techniques for accurate characterization in millimeter (mm) wavelength range of surface impedance of HTS large-area films and can be useful for impedance characterization of small HTS single crystals, including various unconventional superconductors. Hemispherical QDR-based technique for mm impedance characterization of HTS films is analysed theoretically and confirmed experimentally. Such an approach can be applied to QDR of modified forms. The temperature dependences of the YBaCuO films resistance properties using hemispherical resonator and the iron-pnictide single-crystal impedance properties using radially-slotted one are measured in Ka-band.
Keywords :
barium compounds; dielectric resonators; electric impedance measurement; high-temperature superconductors; millimetre wave measurement; millimetre wave resonators; sapphire; superconducting resonators; superconducting thin films; surface resistance; yttrium compounds; HTS films; HTS large-area film surface impedance; HTS single crystal; YBCO; hemispherical QDR-based technique; hemispherical resonator; high-Q sapphire QDR; high-Q sapphire quasioptical dielectric resonator; impedance measurement; iron-pnictide single-crystal impedance properties; millimeter-wave surface impedance characterization; resistance properties; whispering-gallery mode; Electrical resistance measurement; Frequency measurement; High temperature superconductors; Impedance; Resonant frequency; Surface impedance; Temperature measurement; Dielectric resonators; high-temperature superconductors; impedance measurement; millimeter wave measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2100072
