• DocumentCode
    1433733
  • Title

    Edge capacitance in the measurement of dielectric properties

  • Author

    Lynch, A.C.

  • Author_Institution
    General Post Office, Research Station, London, UK
  • Volume
    120
  • Issue
    8
  • fYear
    1973
  • fDate
    8/1/1973 12:00:00 AM
  • Firstpage
    934
  • Lastpage
    938
  • Abstract
    The correction for edge capacitance, which is usually calculated by Kirchhoff´s formula, can be separated by graphical methods into components at various distances from the edge, and so into components which fall within the area of a disc specimen and those which are entirely outside it. In this way, it can be shown that the correction for edge capacitance is usually negligible when permittivity is measured by the adjustment of electrode separation so as to restore the capacitance, after removal of the specimen, to its previous value. The correction to be applied to the observed value of loss tangent is typically about ¿3% of the loss tangent. The paper is a companion to that by Blanco White (p. 939).
  • Keywords
    capacitance; loss-angle measurement; permittivity measurement; dielectric properties; edge capacitance; loss angle measurement; loss tangent; measurement; permittivity measurement;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1973.0208
  • Filename
    5251698