DocumentCode :
1433733
Title :
Edge capacitance in the measurement of dielectric properties
Author :
Lynch, A.C.
Author_Institution :
General Post Office, Research Station, London, UK
Volume :
120
Issue :
8
fYear :
1973
fDate :
8/1/1973 12:00:00 AM
Firstpage :
934
Lastpage :
938
Abstract :
The correction for edge capacitance, which is usually calculated by Kirchhoff´s formula, can be separated by graphical methods into components at various distances from the edge, and so into components which fall within the area of a disc specimen and those which are entirely outside it. In this way, it can be shown that the correction for edge capacitance is usually negligible when permittivity is measured by the adjustment of electrode separation so as to restore the capacitance, after removal of the specimen, to its previous value. The correction to be applied to the observed value of loss tangent is typically about ¿3% of the loss tangent. The paper is a companion to that by Blanco White (p. 939).
Keywords :
capacitance; loss-angle measurement; permittivity measurement; dielectric properties; edge capacitance; loss angle measurement; loss tangent; measurement; permittivity measurement;
fLanguage :
English
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
Publisher :
iet
ISSN :
0020-3270
Type :
jour
DOI :
10.1049/piee.1973.0208
Filename :
5251698
Link To Document :
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