Title :
High resolution frequency-domain reflectometry
Author_Institution :
Vrije Univ., Brussels, Belgium
fDate :
4/1/1990 12:00:00 AM
Abstract :
A high-resolution method for the estimation of the position and magnitude of reflections from frequency-domain measurements is presented. The technique can tackle problems where Fourier-transform-based analysis fails. The connection between high-resolution frequency-domain reflectometry (FDR) and the estimation of the parameters of complex sinusoids with known phase is shown. A suitable algorithm is outlined, and its performance is evaluated analytically and through simulation. To demonstrate its practical applicability, the method is tested on vector network analyzer (VNA) measurements of a coaxial transmission line with a nonuniform dielectric
Keywords :
computerised instrumentation; digital simulation; electronic engineering computing; frequency-domain analysis; network analysers; parameter estimation; reflectometry; waveform analysis; algorithm; coaxial transmission line; complex sinusoids; frequency-domain measurements; frequency-domain reflectometry; magnitude; nonuniform dielectric; parameter estimation; position; reflections; simulation; vector network analyzer; Failure analysis; Frequency domain analysis; Frequency estimation; Frequency measurement; Parameter estimation; Performance analysis; Phase estimation; Position measurement; Reflection; Reflectometry;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
