High resolution frequency-domain reflectometry

Author

Vanhamme, Hugo

Author_Institution

Vrije Univ., Brussels, Belgium

Volume

39

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

369

Lastpage

375

Abstract

A high-resolution method for the estimation of the position and magnitude of reflections from frequency-domain measurements is presented. The technique can tackle problems where Fourier-transform-based analysis fails. The connection between high-resolution frequency-domain reflectometry (FDR) and the estimation of the parameters of complex sinusoids with known phase is shown. A suitable algorithm is outlined, and its performance is evaluated analytically and through simulation. To demonstrate its practical applicability, the method is tested on vector network analyzer (VNA) measurements of a coaxial transmission line with a nonuniform dielectric

Keywords

computerised instrumentation; digital simulation; electronic engineering computing; frequency-domain analysis; network analysers; parameter estimation; reflectometry; waveform analysis; algorithm; coaxial transmission line; complex sinusoids; frequency-domain measurements; frequency-domain reflectometry; magnitude; nonuniform dielectric; parameter estimation; position; reflections; simulation; vector network analyzer; Failure analysis; Frequency domain analysis; Frequency estimation; Frequency measurement; Parameter estimation; Performance analysis; Phase estimation; Position measurement; Reflection; Reflectometry;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.52517

Filename

52517