• DocumentCode
    1434045
  • Title

    Coplanar Waveguides on High-Resistivity Silicon Substrates With Attenuation Constant Lower Than 1 dB/mm for Microwave and Millimeter-Wave Bands

  • Author

    Makita, Takehiko ; Tamai, Isao ; Seki, Shohei

  • Author_Institution
    Oki Electr. Ind. Co., Ltd., Tokyo, Japan
  • Volume
    58
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    709
  • Lastpage
    715
  • Abstract
    Coplanar waveguides (CPWs) with extremely low loss have been successfully developed on high-resistivity silicon (HR-Si) substrates as interposers of multichip modules for microwave and millimeter-wave bands. The attenuation constant of these CPWs on HR-Si is less than 1 dB/mm for frequencies up to 100 GHz, which is comparable with that of CPWs on semi-insulating compound semiconductor substrates. Conventional CPW structures show a larger attenuation constant due to the effects of the low-resistivity layer generated at the interface between the insulating layer of SiN and the HR-Si substrate, which has been detected through both experimental investigations and numerical calculations. A CPW structure that suppresses the effects of the low-resistivity layer is presented in this paper. The fabrication process is rather simple and can be smoothly integrated in conventional semiconductor device fabrication processes.
  • Keywords
    MMIC; coplanar waveguides; electrical resistivity; electromagnetic wave scattering; elemental semiconductors; multichip modules; CPW structures; HR-Si substrate; attenuation constant; coplanar waveguide; fabrication process; high-resistivity silicon substrate; interposer; low-resistivity layer; microwave band; millimeter-wave band; multichip module; semiconductor device fabrication; semiinsulating compound semiconductor substrate; Attenuation constant; coplanar waveguides (CPWs); equivalent circuit calculation; high-resistivity silicon substrate; low-resistivity layer; transmission line theory;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2098878
  • Filename
    5699916