• DocumentCode
    143483
  • Title

    Ferrite bead effect on Class-D amplifier audio quality

  • Author

    El Haddad, Kevin ; Mrad, Roberto ; Morel, Florent ; Pillonnet, Gael ; Vollaire, Christian ; Nagari, Angelo

  • Author_Institution
    MEMS & Sensors (AMS) Group, ST Microelectron., Grenoble, France
  • fYear
    2014
  • fDate
    13-16 April 2014
  • Firstpage
    74
  • Lastpage
    78
  • Abstract
    This paper studies the effect of ferrite beads on the audio quality of Class-D audio amplifiers. This latter is a switching circuit which creates high frequency harmonics. Generally, a filter is used at the amplifier output for the sake of electromagnetic compatibility (EMC). So often, in integrated solutions, this filter contains ferrite beads which are magnetic components and present nonlinear behavior. Time domain measurements and their equivalence in frequency domain are presented. Total Harmonic Distortion (THD) measurements according to the audio signal frequency and amplitude are exposed and discussed. It is shown that ferrite beads introduce up to 30 dB of additional THD which prove the negative effect of the ferrite bead on the amplifier audio quality.
  • Keywords
    audio-frequency amplifiers; electromagnetic compatibility; ferrites; frequency-domain analysis; harmonic distortion; time-domain analysis; EMC; THD measurements; amplifier output; audio quality; audio signal frequency; class-D audio amplifiers; electromagnetic compatibility; ferrite bead effect; frequency domain measurements; high frequency harmonics; magnetic components; nonlinear behavior; switching circuit; time domain measurements; total harmonic distortion measurements; Distortion measurement; Electromagnetic interference; Ferrites; Frequency measurement; Harmonic analysis; Time-domain analysis; Voltage measurement; Audio frequency band; Ferrite bead; Harmonics distortion; Magnetic material;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mediterranean Electrotechnical Conference (MELECON), 2014 17th IEEE
  • Conference_Location
    Beirut
  • Type

    conf

  • DOI
    10.1109/MELCON.2014.6820510
  • Filename
    6820510