• DocumentCode
    1434876
  • Title

    Fast high-voltage pulse generation using nonlinear capacitors

  • Author

    Rim, Geun-Hie ; Lee, Hong-Sik ; Pavlov, Evgueni Pavlovitch ; Kim, Guang-Hoon ; Cho, Chu-Hyun ; Choi, Young-Wook ; Kim, Jong-Soo

  • Author_Institution
    Korea Electrotechnol. Res. Inst., Changwon, South Korea
  • Volume
    28
  • Issue
    5
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1362
  • Lastpage
    1367
  • Abstract
    Many pulsed power applications require short high-voltage pulses with a high-repetition rate. Conventional high-voltage discharge pulse-switches such as thyratrons, spark gap switches, and vacuum tube switches have a short lifetime, whereas the semiconductor switches have a long lifetime and high reliability. The semiconductor switches, however cannot be directly applied to fast high-voltage pulsed power generation due to their limited operating voltage ratings despite their relatively long switching times. Therefore, they are used with voltage amplification and a pulse compression stage. This paper describes two pulse generators that use the semi-conductor switches and nonlinear capacitors: one is based on an opening switch (IGBT) and inductive energy storage, the other is a combination of a closing switch (RSD) and capacitive energy storage
  • Keywords
    amplification; capacitors; inductive energy storage; insulated gate bipolar transistors; power semiconductor switches; pulse compression; pulsed power switches; amplifying ratio; capacitive energy storage; closing switch; fast high voltage pulse generation; high repetition rate; inductive energy storage; lifetime; nonlinear capacitors; opening switch; operating voltage ratings; pulse compression stage; pulsed power applications; reliability; reversely switched dynistor; semiconductor switches; short high-voltage pulses; switching times; voltage amplification; Capacitors; Electron tubes; Energy storage; Power semiconductor switches; Pulse amplifiers; Pulse generation; Semiconductor device reliability; Sparks; Thyratrons; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.901199
  • Filename
    901199