• DocumentCode
    1434975
  • Title

    Final results from the high-current, high-action closing switch test program at Sandia National Laboratories

  • Author

    Savage, Mark E.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    28
  • Issue
    5
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1451
  • Lastpage
    1455
  • Abstract
    We tested a variety of high-current closing switches for lifetime and reliability on a dedicated 2-MJ, 500-kA capacitor bank facility at Sandia National Laboratories. Interest was in a switch capable of one shot every few minutes, switching a critically damped, de-charged 6.2-mF bank at 24 kV, with a peak current of over 500 kA. The desired lifetime is 24000 shots. Typical of high-energy systems, particularly multimodule systems, the primary parameters of interest related to the switch are 1) reliability, meaning absence of both pre-fires and no-fires; 2) total switch lifetime or number of shots between maintenance; 3) cost. Cost was given lower priority at the evaluation stage because there are uncertainties in estimating higher-quantity prices of these devices, most of which have been supplied before in only small quantities. Cost has more importance in choosing between viable candidates after testing The categories of switches tested are vacuum discharge, high-pressure discharge, and solid-state. Each group varies in terms of triggering ease, ease-of-maintenance, and tolerance to faults such as excess current and current reversal. We tested at least two variations of each technology group. The total number of shots on the switch test facility is about 50000. This paper will present the results from the switch testing. The observed lifetime of different switches varied greatly: the shortest life was one shot; one device was still operating after 6000 shots. On several switches, we measured the voltage drop during conduction and calculated energy dissipated in the switch; we will show these data also
  • Keywords
    capacitors; electron device testing; pulsed power switches; spark gaps; thyristors; 2 MJ; 24 kV; 500 kA; 6.2 mF; Sandia National Laboratories; capacitor bank facility; conduction; critically damped de-charged capacitor bank; energy dissipation; high-current closing switches; high-current high-action closing switch test program; high-energy systems; high-pressure discharge; lifetime; multimodule systems; no-fires; peak current; pre-fires; reliability; solid state discharge; vacuum discharge; voltage drop; Capacitors; Costs; Energy measurement; Laboratories; Life testing; Maintenance; Solid state circuits; Switches; Test facilities; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.901213
  • Filename
    901213