Title :
Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA
Author :
Rezgui, Sana ; Wilcox, Edward P. ; Lee, Poongyeub ; Carts, Martin A. ; LaBel, Kenneth ; Nguyen, Victor ; Telecco, Nicola ; McCollum, John
Author_Institution :
Microsemi Corp., Mountain View, CA, USA
Abstract :
TID test results of CMOS Flash-based FPGAs in gamma-rays are presented. The use of realistic low dose-rates and oriented bias-conditions are shown to extend the FPGA TID tolerance. Implications to qualification methods and to most of the new CMOS technologies are noted.
Keywords :
CMOS logic circuits; field programmable gate arrays; flash memories; gamma-ray effects; low-power electronics; CMOS flash-based FPGA; CMOS technology; FPGA TID tolerance; TID test results; bias conditions; gamma-rays; low dose rate conditions; oriented bias-conditions; qualification methods; realistic low dose-rates; total dose tolerance; CMOS integrated circuits; Field programmable gate arrays; Leakage current; Logic gates; Radiation effects; Threshold voltage; Transistors; Annealing; CMOS; TID; floating gate devices; low-dose rate tests; reprogrammable flash-based FPGAs;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2179316
