DocumentCode :
1435086
Title :
A semianalytical parameter-extraction procedure for HBT equivalent circuit
Author :
Li, Bin ; Prasad, Sheila ; Li-Wu Yang ; Wang, S.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
46
Issue :
10
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
1427
Lastpage :
1435
Abstract :
A parameter-extraction approach for the heterojunction bipolar transistor (HBT), which combines the analytical approach and empirical optimization procedure, is developed. The extraction techniques for extrinsic base-collector capacitance and pad parasitics are also included in this approach. The cutoff operation of the HBT´s is utilized to extract the values of the pad capacitances. An excellent fit between measured and simulated S-parameters in the frequency range of 50 MHz-36 GHz is obtained over a wide range of bias points
Keywords :
S-parameters; equivalent circuits; heterojunction bipolar transistors; microwave bipolar transistors; optimisation; semiconductor device models; 50 MHz to 36 GHz; HBT; S-parameters; equivalent circuit; extrinsic base-collector capacitance; heterojunction bipolar transistor; optimization; pad parasitics; semianalytical parameter extraction; Bipolar transistors; Circuit testing; Data mining; Design optimization; Equivalent circuits; Frequency dependence; Frequency measurement; Heterojunction bipolar transistors; Parameter extraction; Parasitic capacitance;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.721144
Filename :
721144
Link To Document :
بازگشت