• DocumentCode
    1435106
  • Title

    FDTD characterization of waveguide-probe structures

  • Author

    Tentzeris, Emmanouil ; Krumpholz, Michael ; Dib, Nihad ; Yook, Jong-Gwan ; Katehi, Linda P B

  • Author_Institution
    Radiation Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    46
  • Issue
    10
  • fYear
    1998
  • Firstpage
    1452
  • Lastpage
    1460
  • Abstract
    The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green´s functions is used to minimize the reflections over a wide band of frequencies.
  • Keywords
    Green´s function methods; S-parameters; finite difference time-domain analysis; probes; waveguide components; waveguide theory; FDTD characterization; S-parameters; analytic Green functions; coplanar feedline probe; diode mounting; finite-difference time-domain technique; geometrical design parameters; waveguide absorber; waveguide-probe structures; Coplanar waveguides; Diodes; Finite difference methods; Frequency; Green´s function methods; Probes; Reflection; Scattering parameters; Time domain analysis; Wideband;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.721147
  • Filename
    721147
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1435106