DocumentCode :
1435106
Title :
FDTD characterization of waveguide-probe structures
Author :
Tentzeris, Emmanouil ; Krumpholz, Michael ; Dib, Nihad ; Yook, Jong-Gwan ; Katehi, Linda P B
Author_Institution :
Radiation Lab., Michigan Univ., Ann Arbor, MI, USA
Volume :
46
Issue :
10
fYear :
1998
Firstpage :
1452
Lastpage :
1460
Abstract :
The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green´s functions is used to minimize the reflections over a wide band of frequencies.
Keywords :
Green´s function methods; S-parameters; finite difference time-domain analysis; probes; waveguide components; waveguide theory; FDTD characterization; S-parameters; analytic Green functions; coplanar feedline probe; diode mounting; finite-difference time-domain technique; geometrical design parameters; waveguide absorber; waveguide-probe structures; Coplanar waveguides; Diodes; Finite difference methods; Frequency; Green´s function methods; Probes; Reflection; Scattering parameters; Time domain analysis; Wideband;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.721147
Filename :
721147
Link To Document :
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