Title :
Study of the Beam Tune-Shift Effects for DEPU at SSRF
Author :
Miao Zhang ; Qiaogen Zhou
Author_Institution :
Shanghai Inst. of Appl. Phys., Shanghai, China
fDate :
6/1/2012 12:00:00 AM
Abstract :
A pair of EPUs (DEPU) with the period 58 mm and 148 mm, covering the energy ranges from 20 to 200 eV and 200 to 2000 eV of arbitrary polarized light, will be developed for the soft X-ray beam line for ARPES and PEEM at SSRF. The effects to the beam tune-shift for DEPU are studied with Kick-Map method via RADIA code and the results are presented in this paper.
Keywords :
X-ray apparatus; light polarisation; photoelectron spectra; wigglers; ARPES; DEPU; Kick-Map method; PEEM; RADIA code; SSRF; beam tune-shift effects; electron volt energy 20 eV to 200 eV; electron volt energy 200 eV to 2000 eV; elliptically polarizing undulators; polarized light; size 148 mm; size 58 mm; soft X-ray beam line; Apertures; Electric potential; Focusing; Linear particle accelerator; Polarization; Storage rings; Undulators; Kick-map; roll-off; tune-shift; undulator;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2011.2182025
