DocumentCode :
1435170
Title :
High-current and high-voltage pulsed testing of resistors
Author :
Shkuratov, Sergey I. ; Kristiansen, Magne ; Dickens, James C. ; Hatfield, Lynn L. ; Horrocks, E.
Author_Institution :
Dept. of Electr. & Comput. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
Volume :
28
Issue :
5
fYear :
2000
fDate :
10/1/2000 12:00:00 AM
Firstpage :
1607
Lastpage :
1614
Abstract :
Three types of resistors have been tested to determine maximum usable power at pulsed high voltage and pulsed high current. Experiments were carried out using high-voltage cable generators, spark gap generators, and thyratron drivers. Pulse durations were varied from 0.7 μs to 21 μs. The pulse amplitudes were varied from 1 kV to 35 kV. The peak current reached was 3 kA. Metal film, carbon film, and carbon composition resistors of four different rated powers (0.25 W, 0.5 W, 1 W, and 2 W) have been tested. Data are given for the limiting pulsed power and energy for each type of resistor in nanosecond and microsecond time ranges. The experimental investigation of the threshold loading of the resistors in the high-current pulsed mode and in the high-voltage pulsed mode has shown that the process of destruction of resistors has specific features for each mode. The mechanisms of failure and destruction of resistors under the action of high-voltage and high-current pulses are discussed
Keywords :
electron device testing; high-voltage techniques; pulse measurement; pulsed power switches; pulsed power technology; resistors; spark gaps; test equipment; 0.25 W; 0.5 W; 0.7 to 21 mus; 1 W; 1 to 35 kV; 2 W; 3 kA; carbon composition resistors; carbon film resistors; destruction process; failure mechanisms; high-current pulsed testing; high-voltage cable generators; high-voltage pulsed testing; limiting pulsed power; metal film resistors; pulse amplitudes; spark gap generators; threshold loading; thyratron drivers; Electronic components; Life testing; Pulse measurements; Pulse transformers; Resistors; Space vector pulse width modulation; Spark gaps; System testing; Thyratrons; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.901242
Filename :
901242
Link To Document :
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