DocumentCode
1435220
Title
V-band high-power low phase-noise monolithic oscillators and investigation of low phase-noise performance high drain bias
Author
Kashiwa, Takuo ; Ishida, Takao ; Katoh, Takayuki ; Kurusu, Hitoshi ; Hoshi, Hiroyuki ; Mitsui, Yasuo
Author_Institution
High Freq. & Optical Semicond. Div., Mitsubishi Electr. Corp., Hyogo, Japan
Volume
46
Issue
10
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1559
Lastpage
1565
Abstract
This paper reports on the excellent performance of V-band monolithic high electron-mobility transistor (HEMT) oscillators, and discusses oscillation characteristics on drain bias. With regard to output characteristics, double-hetero (DH) HEMT (especially with a high-density Si-planar doped layer) are superior to single-hetero (SH) HEMT´s. A monolithic microwave integrated circuit (MMIC) oscillator has been developed with a planar doped DH HEMT and has achieved the peak output power of 11.1 dBm at a 55.9-GHz oscillation frequency. Phase noise of -85 dBc/Hz at 100-kHz offset and -103 dBc/Hz at 1-MHz offset have been achieved at a drain voltage of 5.5 V and a gate voltage of 0 V. These characteristics have been achieved without any buffer amplifiers of dielectric resonators. This study has revealed that the phase noise decreases as drain voltage increases. This phenomenon is caused by lower pushing figure and lower noise level at a low-frequency range obtained under a high drain voltage. It is because the depletion layer in the channel is extended to the drain electrode with increase of drain voltage, resulting in the small fluctuation of the gate-to-source capacitance. We also investigate low-frequency noise spectra of AlGaAs-InGaAs-GaAs DH HEMT´s with different bias conditions. The low-frequency noise decreases for more than 3 V of the drain voltage. A unique mechanism is proposed to explain this phase noise reduction at high drain voltage
Keywords
HEMT integrated circuits; III-V semiconductors; MMIC oscillators; aluminium compounds; gallium arsenide; indium compounds; integrated circuit noise; millimetre wave oscillators; phase noise; 5.5 V; 55.9 GHz; AlGaAs-InGaAs-GaAs; HEMT oscillators; V-band; depletion layer; double-hetero structures; drain voltage; gate-to-source capacitance; high drain bias; low phase-noise monolithic oscillators; noise level; peak output power; pushing figure; DH-HEMTs; HEMTs; Low-frequency noise; MMICs; MODFETs; Microwave integrated circuits; Microwave oscillators; Monolithic integrated circuits; Phase noise; Voltage;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.721165
Filename
721165
Link To Document