• DocumentCode
    1435220
  • Title

    V-band high-power low phase-noise monolithic oscillators and investigation of low phase-noise performance high drain bias

  • Author

    Kashiwa, Takuo ; Ishida, Takao ; Katoh, Takayuki ; Kurusu, Hitoshi ; Hoshi, Hiroyuki ; Mitsui, Yasuo

  • Author_Institution
    High Freq. & Optical Semicond. Div., Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    46
  • Issue
    10
  • fYear
    1998
  • fDate
    10/1/1998 12:00:00 AM
  • Firstpage
    1559
  • Lastpage
    1565
  • Abstract
    This paper reports on the excellent performance of V-band monolithic high electron-mobility transistor (HEMT) oscillators, and discusses oscillation characteristics on drain bias. With regard to output characteristics, double-hetero (DH) HEMT (especially with a high-density Si-planar doped layer) are superior to single-hetero (SH) HEMT´s. A monolithic microwave integrated circuit (MMIC) oscillator has been developed with a planar doped DH HEMT and has achieved the peak output power of 11.1 dBm at a 55.9-GHz oscillation frequency. Phase noise of -85 dBc/Hz at 100-kHz offset and -103 dBc/Hz at 1-MHz offset have been achieved at a drain voltage of 5.5 V and a gate voltage of 0 V. These characteristics have been achieved without any buffer amplifiers of dielectric resonators. This study has revealed that the phase noise decreases as drain voltage increases. This phenomenon is caused by lower pushing figure and lower noise level at a low-frequency range obtained under a high drain voltage. It is because the depletion layer in the channel is extended to the drain electrode with increase of drain voltage, resulting in the small fluctuation of the gate-to-source capacitance. We also investigate low-frequency noise spectra of AlGaAs-InGaAs-GaAs DH HEMT´s with different bias conditions. The low-frequency noise decreases for more than 3 V of the drain voltage. A unique mechanism is proposed to explain this phase noise reduction at high drain voltage
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC oscillators; aluminium compounds; gallium arsenide; indium compounds; integrated circuit noise; millimetre wave oscillators; phase noise; 5.5 V; 55.9 GHz; AlGaAs-InGaAs-GaAs; HEMT oscillators; V-band; depletion layer; double-hetero structures; drain voltage; gate-to-source capacitance; high drain bias; low phase-noise monolithic oscillators; noise level; peak output power; pushing figure; DH-HEMTs; HEMTs; Low-frequency noise; MMICs; MODFETs; Microwave integrated circuits; Microwave oscillators; Monolithic integrated circuits; Phase noise; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.721165
  • Filename
    721165