Perturbation techniques for semiconductor-device computer experiments

The range of problems which can be subjected to computer-simulation studies is increasing rapidly with the development of larger and faster computers. One can obtain results with adequate accuracy for most engineering purposes in simulating complex nonlinear problems such as semiconductor-device behaviour. The truncation error, inherent in any numerical technique, does, however, inhibit the use of such simulation techniques when the issue to be resolved is essentially in the nature of a small perturbation. A numerical perturbation technique which overcomes this problem is described. The method is illustrated by using it to evaluate the temperature sensitivity of voltage-reference diodes. The results are discussed, and suggestions are made concerning the range of problems to which the method can be extended.