DocumentCode
1435699
Title
Measurement of PLL phase error caused by power supply noise
Author
Jenkins, K.A. ; Eckhardt, J.P.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
34
Issue
20
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1907
Lastpage
1908
Abstract
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400 MHz microprocessor
Keywords
circuit noise; circuit testing; errors; microcomputers; noise generators; phase locked loops; phase measurement; 400 MHz; PLL phase error; PLL response measurement; accumulated phase error measurement; microprocessor systems; power supply noise;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981334
Filename
722016
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