Title :
BER performance of OFDM system over frequency nonselective fast Ricean fading channels
Author :
Wan, Lei ; Dubey, V.K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
The fast changing frequency nonselective Ricean fading channel introduces a complicated multiple distortion and an extra additive noise component for an OFDM system. The multiple distortion is the average of the sum of N(N/spl ges/3) correlated Ricean random variables. We propose an approximate technique for calculating the probability density function (PDF) of the multiple distortion under the assumption that the channel response changes in a linear fashion during one OFDM symbol. As a result, the bit error rate (BER) formula of a BPSK modulated OFDM system is derived. The results obtained using the derived formula describe well the OFDM performance under the time variant channel and match very well with the simulation results.
Keywords :
OFDM modulation; Rician channels; error statistics; probability; time-varying channels; BER performance; BPSK; OFDM system; PDF; additive noise; approximate technique; bit error rate; channel response; correlated Ricean random variables; frequency nonselective fast Ricean fading channels; multiple distortion; probability density function; simulation results; time variant channel; Additive noise; Binary phase shift keying; Bit error rate; Bit rate; Fading; Frequency estimation; OFDM modulation; Probability density function; Random variables; Time factors;
Journal_Title :
Communications Letters, IEEE
DOI :
10.1109/4234.901813