DocumentCode
1435766
Title
Classification of very large bit size patterns
Author
Gough, M.P.
Author_Institution
Sch. of Eng., Sussex Univ., Brighton, UK
Volume
34
Issue
20
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1921
Lastpage
1922
Abstract
The author presents the results of tests which extend the published input size of associative list memory (ALM) by two orders of magnitude. In particular, ALM is shown to approach the optimum classifier performance when classifying inputs as large as 105 bits
Keywords
content-addressable storage; pattern classification; associative list memory; input size; optimum classifier performance; very large bit size patterns;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980622
Filename
722026
Link To Document