Title :
Fast calculation of sensitivity distributions in capacitance tomography sensors
Author :
Yan, H. ; Shao, F.Q. ; Wang, S.
Author_Institution :
Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
fDate :
10/1/1998 12:00:00 AM
Abstract :
A fast method for calculating the sensitivity distributions in capacitance tomography sensors, based on the finite element method, is proposed. By fast generation of the global system matrix and capacitance values, the calculation time is reduced by ~98%
Keywords :
capacitance measurement; finite element analysis; sensitivity; tomography; calculation time; capacitance tomography sensors; capacitance values; finite element method; global system matrix; sensitivity distributions;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981176
