DocumentCode
1435833
Title
Fast calculation of sensitivity distributions in capacitance tomography sensors
Author
Yan, H. ; Shao, F.Q. ; Wang, S.
Author_Institution
Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
Volume
34
Issue
20
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1936
Lastpage
1937
Abstract
A fast method for calculating the sensitivity distributions in capacitance tomography sensors, based on the finite element method, is proposed. By fast generation of the global system matrix and capacitance values, the calculation time is reduced by ~98%
Keywords
capacitance measurement; finite element analysis; sensitivity; tomography; calculation time; capacitance tomography sensors; capacitance values; finite element method; global system matrix; sensitivity distributions;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981176
Filename
722037
Link To Document