• DocumentCode
    1435944
  • Title

    Noise Analysis of Time Variant Shapers in Frequency Domain

  • Author

    Gascón, David ; Bota, Sebastià ; Diéguez, Angel ; Garrido, Lluis ; Picatoste, Eduardo

  • Author_Institution
    Dept. of ECM & the ICC, Univ. of Barcelona, Barcelona, Spain
  • Volume
    58
  • Issue
    1
  • fYear
    2011
  • Firstpage
    177
  • Lastpage
    186
  • Abstract
    In this paper we discuss the noise analysis of time variant shapers in the frequency domain, based on well established concepts of the theory of time varying circuits. A frequency domain extension of the techniques typically adopted for noise analysis in detector instrumentation is proposed and applied to a classic time variant shaper: the gated integrator. In some cases, this frequency domain method makes easier the study of systems in which one of the blocks or noise sources is better described in the frequency domain. In that sense, a practical case involving a gated integrator and a Correlated Double Sampler (CDS) time variant shaper is presented.
  • Keywords
    frequency-domain analysis; integrated circuit noise; integrating circuits; nuclear electronics; nuclear instrumentation; radiation detection; CDS time variant shaper; Correlated Double Sampler; detector instrumentation; frequency domain method; gated integrator; noise analysis; time varying circuits; $1/f$ noise; correlated double sampler (CDS); gated integrator; low noise electronics; time variant shapers; time varying circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2101082
  • Filename
    5701789