DocumentCode
1435944
Title
Noise Analysis of Time Variant Shapers in Frequency Domain
Author
Gascón, David ; Bota, Sebastià ; Diéguez, Angel ; Garrido, Lluis ; Picatoste, Eduardo
Author_Institution
Dept. of ECM & the ICC, Univ. of Barcelona, Barcelona, Spain
Volume
58
Issue
1
fYear
2011
Firstpage
177
Lastpage
186
Abstract
In this paper we discuss the noise analysis of time variant shapers in the frequency domain, based on well established concepts of the theory of time varying circuits. A frequency domain extension of the techniques typically adopted for noise analysis in detector instrumentation is proposed and applied to a classic time variant shaper: the gated integrator. In some cases, this frequency domain method makes easier the study of systems in which one of the blocks or noise sources is better described in the frequency domain. In that sense, a practical case involving a gated integrator and a Correlated Double Sampler (CDS) time variant shaper is presented.
Keywords
frequency-domain analysis; integrated circuit noise; integrating circuits; nuclear electronics; nuclear instrumentation; radiation detection; CDS time variant shaper; Correlated Double Sampler; detector instrumentation; frequency domain method; gated integrator; noise analysis; time varying circuits; $1/f$ noise; correlated double sampler (CDS); gated integrator; low noise electronics; time variant shapers; time varying circuits;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2010.2101082
Filename
5701789
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