DocumentCode
1436019
Title
Method for BJT transit time evaluation
Author
Zimmer, T. ; Duluc, J.B. ; Lewis, N.
Author_Institution
Bordeaux I Univ., Talence, France
Volume
34
Issue
20
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1979
Lastpage
1980
Abstract
A new method is presented for calculating the forward transit time of bipolar junction transistors. The method uses three easily extractable SPICE parameters from the Gummel Poon model. No S parameter measurements are necessary to determine the forward transit time, only DC and C(V) measurements need to be performed, and no technological information is needed
Keywords
SPICE; bipolar transistors; semiconductor device models; BJT; Gummel Poon model; SPICE parameter extraction; bipolar junction transistor; transit time;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981219
Filename
722066
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