DocumentCode :
1436123
Title :
Ultrathin Optoelectronic Device Packaging in Flexible Carriers
Author :
Bosman, Erwin ; Missinne, Jeroen ; Van Hoe, Bram ; Van Steenberge, Geert ; Kalathimekkad, Sandeep ; Van Erps, Jürgen ; Milenkov, Ivaylo ; Panajotov, Krassimir ; Van Gijseghem, Tim ; Dubruel, Peter ; Thienpont, Hugo ; Daele, P.
Author_Institution :
INTEC Dept., Ghent Univ., Ghent, Belgium
Volume :
17
Issue :
3
fYear :
2011
Firstpage :
617
Lastpage :
628
Abstract :
This paper presents the development of an advanced packaging technique for commercially available optoelectronic devices. Vertical cavity surface emitting laser (VCSEL) diodes and photodiodes are thinned down to 20 μm thickness, and are embedded in flexible carriers, resulting in a 75-μm-thin package, which can be bent down to a bending radius of 2 mm. Electrical, optical, and mechanical characterization addresses the influence of thinning and embedding of bare optoelectronic chips on their main properties. Next to the embedded optoelectronics, also electrical ICs like amplifiers and drivers can be housed in the same thin flexible package, using an identical technology and layer build-up. Finally, this new packaging approach is demonstrated in two different integrated sensor applications and in an integrated optical interconnection. For the latter application, also waveguides and optical out-of-plane coupling elements are integrated in the package and the complete system reliability is assessed by accelerated aging tests.
Keywords :
ageing; bending; electronics packaging; flexible electronics; integrated optics; integrated optoelectronics; optical couplers; optical interconnections; optical sensors; optical waveguides; photodiodes; reliability; semiconductor lasers; surface emitting lasers; aging tests; amplifiers; bending radius; electrical IC; electrical properties; flexible carriers; integrated optical interconnection; integrated sensor applications; mechanical properties; optical out-of-plane coupling; optical properties; optical waveguides; packaging technique; photodiodes; radius 2 mm; size 75 mum; thinning; ultrathin optoelectronic device packaging; vertical cavity surface emitting laser diodes; Gallium arsenide; Packaging; Polyimides; Resistance; Semiconductor device measurement; Vertical cavity surface emitting lasers; Embedding; flexible; packaging; photodiode; thinning; vertical cavity surface-emitting laser (VCSEL);
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2010.2096407
Filename :
5702264
Link To Document :
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