Title :
Fabry–Pérot Laser Characterization Based on the Amplified Spontaneous Emission Spectrum and the Fourier Series Expansion Method
Author :
Guo, Wei-Hua ; Byrne, Diarmuid C. ; Lu, Qiaoyin ; Corbett, Brian ; Donegan, John F.
Author_Institution :
Semicond. Photonics Group, Trinity Coll., Dublin, Ireland
Abstract :
Comprehensive Fabry-Pérot laser characterization based on measurements of the amplified spontaneous emission spectrum analyzed using the Fourier series expansion method is presented. The parameters of net modal gain, internal loss, quasi-Fermi level separation, linewidth enhancement factor, injection efficiency, and geometric spontaneous emission factor can all be extracted.
Keywords :
Fermi level; Fourier series; laser beams; optical losses; optical variables measurement; semiconductor lasers; spectral line breadth; superradiance; Fabry-Perot laser properties; Fourier series expansion method; amplified spontaneous emission spectrum; geometric spontaneous emission factor; injection efficiency; internal loss; linewidth enhancement factor; net modal gain; quasiFermi level separation; Cavity resonators; Current measurement; Laser modes; Measurement by laser beam; Semiconductor lasers; Spontaneous emission; Waveguide lasers; Amplified spontaneous emission (ASE); Fabry–Pérot (FP) laser; injection efficiency; internal loss; linewidth enhancement factor; modal gain; spontaneous emission factor;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2010.2096502
