DocumentCode :
1436221
Title :
Adaptive Performance Compensation With In-Situ Timing Error Predictive Sensors for Subthreshold Circuits
Author :
Fuketa, Hiroshi ; Hashimoto, Masanori ; Mitsuyama, Yukio ; Onoye, Takao
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
Volume :
20
Issue :
2
fYear :
2012
Firstpage :
333
Lastpage :
343
Abstract :
We present an adaptive technique for compensating manufacturing and environmental variability in subthreshold circuits using “canary flip-flop (FF),” which can predict timing errors. A 32-bit Kogge-Stone adder whose performance was controlled by body-biasing was fabricated in a 65-nm CMOS process. Measurement results show that the adaptive control can compensate process, supply voltage, and temperature variations and improve the energy efficiency of subthreshold circuits by up to 46% compared to worst-case design and operation with guardbanding. We also discuss how to determine design parameters, such as the inserted location and the buffer delay of the canary FF, supposing two approaches: configuration in the design phase and post-silicon tuning.
Keywords :
CMOS logic circuits; adaptive control; adders; buffer circuits; energy conservation; error compensation; flip-flops; integrated circuit design; integrated circuit manufacture; power aware computing; timing circuits; CMOS process; Kogge-Stone adder; adaptive control; adaptive performance compensation; body-biasing; buffer delay; canary FF; canary flip-flop; design parameter determination; energy efficiency; environmental variability compensation; guardbanding; in-situ timing error predictive sensor; manufacturing variability compensation; post-silicon tuning; size 65 nm; subthreshold circuits; supply voltage compensation; temperature variation compensation; word length 32 bit; worst-case design; Delay; Monitoring; Power dissipation; Temperature measurement; Velocity control; Voltage control; Adaptive speed control; body biasing; manufacturing variability; subthreshold circuit; timing error prediction;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2101089
Filename :
5702356
Link To Document :
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